Company Profile
Lasertec designs, manufactures, and sells inspection and measurement equipment in Japan, South Korea, Taiwan, Other Asia, the United States. The company offers semiconductor related products, including Actinic EUV patterned mask inspection system, EUV mask blanks inspection and review system, mask inspection system, mask blanks inspection and review system, EUV pellicle inspection system, EUV mask backside inspection and cleaning system, and mask edge inspection system.
Its portfolio also includes phase-shift and transmittance measurement system, phase-shift measurement system, and SiC wafer inspection and review system, GaN wafer inspection and review system, high sensitivity under-layer defect inspection and review system, multi-wavelength wafer inspection system, high sensitivity wafer edge inspection system, wafer edge-dimension measurement system, via depth measurement system, TSV back grinding process measurement system, and fully automated wafer measurement system, as well as FPD photomask inspection system, pellicle inspection and pellicle mounting system for CLIOS, and FPD mask blanks inspection system; and microscopes, such as laser microscopes, electro-chemical reaction visualizing confocal system, and in-situ observation at ultra high temperature confocal scanning laser microscope. Founded in 1960 and headquartered in Yokohama, Japan, Lasertec was formerly known as NJS Corporation before rebranding in 1986.